W/B4C multilayer x-ray mirrors

Alan F. Jankowski; Daniel M. Makowiecki

doi:10.1117/12.56018

1 December 1991 W/B4C multilayer x-ray mirrors

Alan F. Jankowski, Daniel M. Makowiecki

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Optical Engineering, Vol. 30, Issue 12, (December 1991). https://doi.org/10.1117/12.56018

Abstract

One of the most important considerations in the design and manufacture of multilayer mirrors is material compatibility. Ideally, the materials selected should not chemically react or interdiffuse, thereby avoiding the formation of second phases, thus enhancing the smoothness of the layer interfaces and the reflectivity of the optic. The transparency of the spacing layers can therefore be augmented by materials of low absorption. Initial findings with B₄C layers indicate deposits that show smoother layering than those containing carbon, with the advantages of greater stability, lower absorption, and therefore greater reflectivity. The manufacture, microstructure, and reflectivity of W/B₄C multilayers are discussed.

Citation Download Citation

Alan F. Jankowski and Daniel M. Makowiecki "W/B4C multilayer x-ray mirrors," Optical Engineering 30(12), (1 December 1991). https://doi.org/10.1117/12.56018

Published: 1 December 1991

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