Journal of Electronic Imaging
VOL. 33 · NO. 3 | May 2024
CONTENTS
Special Section on Quality Control by Artificial Vision VII
Journal of Electronic Imaging, Vol. 33, Issue 03, 031201, (June 2024) https://doi.org/10.1117/1.JEI.33.3.031201
Open Access
TOPICS: Quality control, Machine vision, Computer vision technology, Deep learning, Data modeling, 3D modeling, Thermal modeling, 3D image processing, Shape analysis, Inspection
Kevin Helvig, Pauline Trouvé-Peloux, Ludovic Gavérina, Jean-Michel Roche, Baptiste Abeloos
Journal of Electronic Imaging, Vol. 33, Issue 03, 031202, (February 2024) https://doi.org/10.1117/1.JEI.33.3.031202
TOPICS: Thermography, Education and training, Databases, Deep learning, Machine learning, Data modeling, Image restoration, Tunable filters, Thermal modeling, Object detection
Nikola Pižurica, Kosta Pavlović, Slavko Kovačević, Igor Jovančević, Miguel de Prado
Journal of Electronic Imaging, Vol. 33, Issue 03, 031203, (February 2024) https://doi.org/10.1117/1.JEI.33.3.031203
TOPICS: Image segmentation, Data modeling, Mathematical optimization, Performance modeling, Education and training, Network architectures, Visual inspection, Defect detection, Visual process modeling, Deep learning
Isaac Wilfried Sanou, Julien Baderot, Stéphanie Bricq, Yannick Benezeth, Franck Marzani, Sergio Martinez, Johann Foucher
Journal of Electronic Imaging, Vol. 33, Issue 03, 031204, (February 2024) https://doi.org/10.1117/1.JEI.33.3.031204
TOPICS: Electron microscopy, Deep learning, Education and training, Metrology, Image segmentation, Contour modeling, Laser sintering, Manufacturing, Performance modeling, Data modeling
Velibor Došljak, Igor Jovančević, Jean-José Orteu
Journal of Electronic Imaging, Vol. 33, Issue 03, 031205, (February 2024) https://doi.org/10.1117/1.JEI.33.3.031205
TOPICS: Data modeling, Education and training, Point clouds, Computer aided design, 3D modeling, Solid modeling, Inspection, Sensors, Machine learning, Deep learning
Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Béraud
Journal of Electronic Imaging, Vol. 33, Issue 03, 031206, (March 2024) https://doi.org/10.1117/1.JEI.33.3.031206
TOPICS: Calibration, Cameras, 3D modeling, 3D image processing, Speckle pattern, Additive manufacturing, Manufacturing, Deformation, 3D projection, Matrices
Domen Rački, Dejan Tomaževič, Danijel Skočaj
Journal of Electronic Imaging, Vol. 33, Issue 03, 031207, (March 2024) https://doi.org/10.1117/1.JEI.33.3.031207
TOPICS: Education and training, Image segmentation, Statistical modeling, Feature extraction, Data modeling, Performance modeling, Defect detection, Network architectures, Inspection, Deep learning
Stefano Toigo, Brendon Kasi, Daniele Fornasier, Angelo Cenedese
Journal of Electronic Imaging, Vol. 33, Issue 03, 031208, (March 2024) https://doi.org/10.1117/1.JEI.33.3.031208
TOPICS: Image processing, Cameras, Industrial applications, Quality control, Defect detection, Object detection, Education and training, Mathematical optimization, Computation time, Data modeling
Journal of Electronic Imaging, Vol. 33, Issue 03, 031209, (April 2024) https://doi.org/10.1117/1.JEI.33.3.031209
TOPICS: 3D image processing, 3D tracking, X-ray computed tomography, X-rays, X-ray imaging, Education and training, Image segmentation, Visualization, Particles, Nondestructive evaluation
Ichraq Lemghari, Sylvie Le Hégarat-Mascle, Emanuel Aldea, Jennifer Vandoni
Journal of Electronic Imaging, Vol. 33, Issue 03, 031210, (June 2024) https://doi.org/10.1117/1.JEI.33.3.031210
TOPICS: Education and training, Calibration, Binary data, Machine learning, Matrices, Data analysis, Data modeling, Statistical modeling, Error analysis, Modeling
Saïd Rahmani, Roger de Souza Lima, Eric Serris, Ana Cameirão, Johan Debayle
Journal of Electronic Imaging, Vol. 33, Issue 03, 031211, (June 2024) https://doi.org/10.1117/1.JEI.33.3.031211
TOPICS: Crystals, Crystallization, Video, Image segmentation, Image processing, Particles, Image analysis, Video processing, Sensors, Binary data
Regular Articles
Liang Gong, Hang Dong, Xinyu Zhang, Xin Cheng, Fan Ye, Liangchao Guo, Zhenghui Ge
Journal of Electronic Imaging, Vol. 33, Issue 03, 033001, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033001
TOPICS: Neurons, Laser induced fluorescence, Transformers, Neural networks, Education and training, Data modeling, Feature extraction, Head, Performance modeling, Machine learning
Bingyin Tang, Fan Feng
Journal of Electronic Imaging, Vol. 33, Issue 03, 033002, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033002
TOPICS: Transformers, Data modeling, Performance modeling, Image processing, Super resolution, Image quality, Education and training, Modeling, Medical imaging, Gallium nitride
Chaoxia Zhang, Kaiqi Liang, Shangzhou Zhang, Zhihao Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033003, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033003
TOPICS: Digital watermarking, Image encryption, Information security, Image quality, Image processing, Image transmission, Wavelet transforms, Image restoration, Matrices, Computer security
Li Huang, JingKe Yan, Min Wang, Qin Wang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033004, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033004
TOPICS: Image restoration, Image quality, Diffusion, Super resolution, Lawrencium, Education and training, Image processing, Data modeling, Visualization, Denoising
Robin Bruneau, Baptiste Brument, Lilian Calvet, Matthew Cassidy, Jean Mélou, Yvain Quéau, Jean-Denis Durou, François Lauze
Journal of Electronic Imaging, Vol. 33, Issue 03, 033005, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033005
TOPICS: Refraction, 3D modeling, Interfaces, Cameras, Point clouds, 3D image processing, Matrices, Epoxies, 3D projection, Optical spheres
Yining Wang, Jinyi Zhang, Yuxi Jiang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033006, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033006
TOPICS: Cameras, 3D modeling, Process modeling, Image processing, Motion models, Motion blur, Motion estimation, Image sharpness, 3D image processing, Interpolation
Huipu Xu, Zegang He, Shuo Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033007, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033007
TOPICS: Object detection, Education and training, Feature fusion, Convolution, Detection and tracking algorithms, Feature extraction, Ablation, Neck, Image fusion, Environmental sensing
Jing Zhang, Yulin Tang, Yusong Luo, Yukun Du, Mingju Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033008, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033008
TOPICS: Transformers, Object detection, Education and training, Feature extraction, Detection and tracking algorithms, Data modeling, Windows, Head, Robotics, Image segmentation
Yunzuo Zhang, Yameng Liu, Jiayu Zhang, Shasha Zhang, Shuangshuang Wang, Yu Cheng
Journal of Electronic Imaging, Vol. 33, Issue 03, 033009, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033009
TOPICS: Video, Video surveillance, Reconstruction algorithms, Surveillance, Detection and tracking algorithms, Video processing, Visualization, Interpolation, Reflection, Molybdenum
Xiaowen Yang, Qingwu Li, Dabing Yu, Zheng Gao, Guanying Huo
Journal of Electronic Imaging, Vol. 33, Issue 03, 033010, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033010
TOPICS: Semantics, Polarization, Object detection, Target detection, Spatial learning, Feature extraction, Submerged target detection, Convolution, RGB color model, Head
Xianwu Huang, Yuxiao Wang, Zhao Cao, Haili Shang, Jinshan Zhang, Dahua Yu
Journal of Electronic Imaging, Vol. 33, Issue 03, 033011, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033011
TOPICS: Deblurring, Feature extraction, Image quality, Image processing, Education and training, Image restoration, Gallium nitride, Image analysis, Data modeling, Network architectures
Xin Wen, Hao Shen, Zhongqiu Zhao
Journal of Electronic Imaging, Vol. 33, Issue 03, 033012, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033012
TOPICS: Data modeling, Performance modeling, Statistical modeling, Education and training, Machine learning, Synthetic aperture radar, Alignment modeling, Process modeling, Error analysis, Fiber optic gyroscopes
Wei Song, Dongmei Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033013, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033013
TOPICS: Semantics, Data modeling, Performance modeling, Visualization, Feature extraction, Feature fusion, Image classification, Image enhancement, Visual process modeling, Image fusion
Xiaoyou Yu, Zixiao Wang, Zhonghua Miao, Nan Li, Teng Sun
Journal of Electronic Imaging, Vol. 33, Issue 03, 033014, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033014
TOPICS: Atmospheric modeling, Object detection, Light sources and illumination, Target detection, Performance modeling, Feature fusion, Feature extraction, Detection and tracking algorithms, Education and training, Data modeling
Yang Yang, Changjiang Liu, Hao Li, Chuan Liu
Journal of Electronic Imaging, Vol. 33, Issue 03, 033015, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033015
TOPICS: Image segmentation, Semantics, Image enhancement, Histograms, Light sources and illumination, Image processing, Data modeling, Buildings, Image quality, Roads
Guang Huo, Ruyuan Li, Jianlou Lou, Xiaolu Yu, Jiajun Wang, Xinlei He, Yue Wang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033016, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033016
TOPICS: Iris recognition, Detection and tracking algorithms, Matrices, Feature extraction, Education and training, Eye models, Deep learning, Image processing, Image processing algorithms and systems, Facial recognition systems
Min Zhao, XueZhong Qian, Wei Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033017, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033017
TOPICS: Color, Semantics, Feature extraction, Image quality, Visualization, Education and training, Image processing, Data modeling, Ablation, Image fusion
Yuhui Zhao, Ruifeng Yang, Chenxia Guo, Xiaole Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033018, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033018
TOPICS: Object detection, Target detection, Remote sensing, Head, Transformers, Feature fusion, Feature extraction, Image enhancement, Detection and tracking algorithms, Data modeling
Jun Su, Heping Zhang, Krzysztof Przystupa, Orest Kochan
Journal of Electronic Imaging, Vol. 33, Issue 03, 033019, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033019
TOPICS: Object detection, Defect detection, Convolution, Feature fusion, Data modeling, Detection and tracking algorithms, Performance modeling, Deep learning, Feature extraction, Machine learning
Pengbo Zhou, Zhiqiang Yang, Longquan Yan, Guohua Geng, Mingquan Zhou
Journal of Electronic Imaging, Vol. 33, Issue 03, 033020, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033020
TOPICS: Convolution, Image processing, Image quality, Data modeling, Performance modeling, Education and training, Visualization, Semantics, Gallium nitride, Transformers
Jiahao Li, Xiaohong Han
Journal of Electronic Imaging, Vol. 33, Issue 03, 033021, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033021
TOPICS: Object detection, 3D modeling, Autonomous driving, 3D image processing, Feature fusion, Feature extraction, Cameras, Stereoscopic cameras, LIDAR, Ablation
Yuhang Zhao, Ping Zhao
Journal of Electronic Imaging, Vol. 33, Issue 03, 033022, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033022
TOPICS: Denoising, Image denoising, Matrices, Eye models, Diffusion, Cameras, Mathematical modeling, Image filtering, Edge detection, Eigenvectors
Xiaoju Yin, Li Zhou, Bo Li
Journal of Electronic Imaging, Vol. 33, Issue 03, 033023, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033023
TOPICS: Equipment, Detection and tracking algorithms, Calculus, Lithium, Convolution, Image processing, Light sources and illumination, Inspection, Image processing algorithms and systems, Radon transform
Dan Chen, Heng Zhang, Linao Tang, Zichen Wang, Jiahao Li
Journal of Electronic Imaging, Vol. 33, Issue 03, 033024, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033024
TOPICS: LIDAR, Detection and tracking algorithms, Visualization, Data fusion, Matrices, Associative arrays, Point clouds, Mathematical optimization, Environmental sensing, Pose estimation
Hao Jiang, Shicong Huang, Zhiheng Jin, Minggui Zhang, Jing Chen, Xiren Miao
Journal of Electronic Imaging, Vol. 33, Issue 03, 033025, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033025
TOPICS: Data modeling, Defect detection, Education and training, Performance modeling, Statistical modeling, Target detection, Connectors, Object detection, Feature extraction, Data storage
Bisma Sultan, Mohd. Arif Wani
Journal of Electronic Imaging, Vol. 33, Issue 03, 033026, (May 2024) https://doi.org/10.1117/1.JEI.33.3.033026
TOPICS: Steganography, Education and training, Deep learning, Gallium nitride, Image restoration, Image quality, Distortion, Data modeling, Network security, Performance modeling
Man Lin, Gang Cao, Zijie Lou, Chi Zhang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033027, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033027
TOPICS: Video, Video compression, Video acceleration, Fusion splicing, Education and training, Feature fusion, Video coding, Forensic science, Feature extraction, Video processing
Shen-Chuan Tai, Chia-Mao Yeh, Yu-Ting Lee, Wesley Huang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033028, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033028
TOPICS: Image compression, Image quality, Image restoration, Image enhancement, Image processing, Windows, Distortion, Visualization, Video coding, Visual compression
Xiong Shen, Yiqin Lu, Zhe Cheng, Zhongshu Mao, Zhang Yang, Jiancheng Qin
Journal of Electronic Imaging, Vol. 33, Issue 03, 033029, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033029
TOPICS: Image restoration, Defense and security, Image classification, Education and training, Gallium nitride, Neural networks, Adversarial training, Feature extraction, Reconstruction algorithms, Image processing
Guoxiang Tong, Xinrong Yan
Journal of Electronic Imaging, Vol. 33, Issue 03, 033030, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033030
TOPICS: Convolution, RGB color model, Video, Performance modeling, Feature extraction, Data modeling, Statistical modeling, Printing, Education and training, Light sources and illumination
Weina Dong, Jia Liu, Lifeng Chen, Wenquan Sun, Xiaozhong Pan
Journal of Electronic Imaging, Vol. 33, Issue 03, 033031, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033031
TOPICS: Education and training, Steganography, Data modeling, 3D modeling, Neural networks, Cameras, Receivers, Performance modeling, 3D image processing, Overfitting
Qian Zhao, Qianxi Yin
Journal of Electronic Imaging, Vol. 33, Issue 03, 033032, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033032
TOPICS: Image restoration, Remote sensing, Image fusion, Image quality, Feature fusion, Reconstruction algorithms, Image enhancement, Lawrencium, Convolution, Feature extraction
Lu Ronghui, Tzong-Jer Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033033, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033033
TOPICS: Image segmentation, Image filtering, Tunable filters, Digital filtering, Gaussian filters, Denoising, Optical filters, Semantics, Contour modeling, Image enhancement
Wang Hao, Peng Taile, Zhou Ying
Journal of Electronic Imaging, Vol. 33, Issue 03, 033034, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033034
TOPICS: Image restoration, Feature extraction, Performance modeling, Feature fusion, Super resolution, Image fusion, Data modeling, Image processing, Lawrencium, Education and training
Naresh Vedhamuru, Ramanathan Malmathanraj, Palanisamy Ponnusamy
Journal of Electronic Imaging, Vol. 33, Issue 03, 033035, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033035
TOPICS: Convolution, Education and training, Diseases and disorders, Machine learning, Neurological disorders, Data modeling, Deep learning, Tunable filters, Performance modeling, Neural networks
Mengqi Chen, Yifan Wang, Qian Sun, Weiming Wang, Fu Lee Wang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033036, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033036
TOPICS: Image retrieval, Education and training, Convolution, Feature extraction, Neural networks, Visualization, Matrices, Network architectures, Databases, Scanning probe lithography
Ping Gao, Guidong Zhang, Lingling Chen, Xiaoyun Chen
Journal of Electronic Imaging, Vol. 33, Issue 03, 033037, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033037
TOPICS: Image enhancement, Neurons, Negative feedback, Signal attenuation, Neural networks, Gamma correction, Tunable filters, Image processing, Histograms, Matrices
Zhonggui Sun, Can Zhang, Mingzhu Zhang
Journal of Electronic Imaging, Vol. 33, Issue 03, 033038, (June 2024) https://doi.org/10.1117/1.JEI.33.3.033038
TOPICS: Matrices, Reliability, Semantics, Image segmentation, Tunable filters, Computer vision technology, Education and training, Convolution, Image quality, Visualization
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