Open Access
26 February 2016 Characterization of natural and irradiated nails by means of the depolarization metrics
Sergey N. Savenkov, Alexander V. Priezzhev, Yevgen A. Oberemok, Sergey Sholom, Ivan Kolomiets, Kateryna Chunikhina
Author Affiliations +
Abstract
Mueller polarimetry is applied to study the samples of nails: natural (or reference) and irradiated to 2 Gy ionizing radiation dose. We measure the whole Mueller matrices of the samples as a function of the scattering angle at a wavelength of 632.8 nm. We apply depolarization analysis to measured Mueller matrices by calculating the depolarization metrics [depolarization index, Q(M)-metric, first and second Lorenz indices, Cloude and Lorenz entropy] to quantify separability of the different samples of nails under study based on differences in their Mueller matrix. The results show that nail samples strongly depolarize the output light in backscattering, and irradiation in all cases results in increasing of depolarization. Most sensitive among depolarization metrics are the Lorenz entropy and Q(M)-metric.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE) 1083-3668/2016/$25.00 © 2016 SPIE
Sergey N. Savenkov, Alexander V. Priezzhev, Yevgen A. Oberemok, Sergey Sholom, Ivan Kolomiets, and Kateryna Chunikhina "Characterization of natural and irradiated nails by means of the depolarization metrics," Journal of Biomedical Optics 21(7), 071108 (26 February 2016). https://doi.org/10.1117/1.JBO.21.7.071108
Published: 26 February 2016
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scattering

Polarimetry

Light scattering

Polarization

Mueller matrices

Polysomnography

Ionizing radiation

Back to Top