Open Access
13 November 2014 Modeling the tight focusing of beams in absorbing media with Monte Carlo simulations
Author Affiliations +
Abstract
A severe drawback to the scalar Monte Carlo (MC) method is the difficulty of introducing diffraction when simulating light propagation. This hinders, for instance, the accurate modeling of beams focused through microscope objectives, where the diffraction patterns in the focal plane are of great importance in various applications. Here, we propose to overcome this issue by means of a direct extinction method. In the MC simulations, the photon paths’ initial positions are sampled from probability distributions which are calculated with a modified angular spectrum of the plane waves technique. We restricted our study to the two-dimensional case, and investigated the feasibility of our approach for absorbing yet nonscattering materials. We simulated the focusing of collimated beams with uniform profiles through microscope objectives. Our results were compared with those yielded by independent simulations using the finite-difference time-domain method. Very good agreement was achieved between the results of both methods, not only for the power distributions around the focal region including diffraction patterns, but also for the distribution of the energy flow (Poynting vector).
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2014/$25.00 © 2014 SPIE
Arnd R. Brandes, Ahmed Elmaklizi, H. Günhan Akarcay, and Alwin Kienle "Modeling the tight focusing of beams in absorbing media with Monte Carlo simulations," Journal of Biomedical Optics 19(11), 115003 (13 November 2014). https://doi.org/10.1117/1.JBO.19.11.115003
Published: 13 November 2014
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Monte Carlo methods

Finite-difference time-domain method

Optical simulations

Absorption

Computer simulations

Refractive index

Diffraction

Back to Top