This study proposes a novel approach to streamline the manual identification and classification of 2D materials on-chip devices, crucial for rapid prototyping. Leveraging high-resolution imaging and smart stitching techniques, our method achieves a comprehensive representation of the material landscape. Advanced image processing algorithms, including mask-RCNN segmentation, extract key material attributes such as surface area and morphology. A tailored U-Net model is trained for precise material identification, encompassing parameters like composition and thickness. Performance evaluation involves state-of-the-art model architectures and hyperparameter optimization. By automating the material identification process and integrating with a sophisticated transfer system, manual intervention is minimized, expediting prototyping workflows. This framework not only enhances efficiency but also aligns with contemporary trends in materials science and machine learning research, fostering advancements in rapid prototyping capabilities.
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