Qualifying transmon qubits using dc transport measurements

Venkat Chandrasekhar

doi:10.1117/12.3011695

13 March 2024 Qualifying transmon qubits using dc transport measurements

Venkat Chandrasekhar

Proceedings Volume PC12912, Quantum Sensing, Imaging, and Precision Metrology II; PC129123A (2024) https://doi.org/10.1117/12.3011695
Event: SPIE Quantum West, 2024, San Francisco, California, United States

Abstract

Low noise dc electrical transport measurements provide a reliable means of characterizing the quality of the Josephson junctions (JJs) that form the heart of superconducting qubits. Measurements of the current-voltage (IV) characteristics can provide a direct readout of important junction parameters such as the Josephson energy Ej and the charging energy Ec. Here we report our investigation of an unexpected feature in the IV characteristics: the appearance of a finite resistance at currents below the critical current, where the resistance of the junction is expected to vanish. This “zero bias” resistance is observed in all the JJs that we have measured, fabricated by four different groups in the SQMS collaboration. The origin of this zero bias resistance and its potential implications for qubit performance will be discussed.

Conference Presentation

Citation Download Citation

Venkat Chandrasekhar "Qualifying transmon qubits using dc transport measurements", Proc. SPIE PC12912, Quantum Sensing, Imaging, and Precision Metrology II, PC129123A (13 March 2024); https://doi.org/10.1117/12.3011695

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