Presentation
9 March 2024 Measurement of dispersion uniformity of photonic crystal fibers using white light interferometry
Author Affiliations +
Proceedings Volume PC12882, Optical Components and Materials XXI; PC128820J (2024) https://doi.org/10.1117/12.2692997
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
The dispersion uniformity of a commercially available and a custom-fabricated photonic crystal fiber (PCF) was characterized with a white light interferometry (WLI) setup between 900 - 1100 nm. The custom-fabricated PCFs displayed up to 1.5 times less variation in β2 and β3 for neighboring 50 cm long pieces and the largest variation between two 50-cm long pieces within a 5m long fiber section. As changes in dispersion can be caused by fabrication tolerances, this can be regarded as an effective metric to evaluate fiber fabrication uniformity.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy Lim, Daniel L. Rhonehouse, Geoffrey D. Chin, Rafael R. Gattass, Lynda E. Busse, L. Brandon Shaw, and Michelle Y. Sander "Measurement of dispersion uniformity of photonic crystal fibers using white light interferometry", Proc. SPIE PC12882, Optical Components and Materials XXI, PC128820J (9 March 2024); https://doi.org/10.1117/12.2692997
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KEYWORDS
Dispersion

Optical interferometry

Photonic crystal fibers

Fabrication

Materials properties

Phase measurement

Tolerancing

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