250 kHz repetition rate OPA and 6 EV line for TR-ARPES measurement

Gaëtan Jargot; Adrien Longa; Jean-Michel Parent; Dario Armanno; Benson Frimpong; François Légaré; Fabio Boschini

doi:10.1117/12.3001015

13 March 2024 250 kHz repetition rate OPA and 6 EV line for TR-ARPES measurement

Gaëtan Jargot, Adrien Longa, Jean-Michel Parent, Dario Armanno, Benson Frimpong, François Légaré, Fabio Boschini

Proceedings Volume PC12869, Nonlinear Frequency Generation and Conversion: Materials and Devices XXIII; PC128690R (2024) https://doi.org/10.1117/12.3001015
Event: SPIE LASE, 2024, San Francisco, California, United States

Abstract

Ultrashort and intense tunable Mid-IR source promise new insights into the investigation of electron dynamics in quantum materials. Recently, we have developed an OPA providing intense optical excitation in near- and mid-infrared region (1.7 to 8 µm), and it is now used as a pump for time- and angle-resolved photoemission (TR-ARPES). We will discuss preliminary TR-ARPES results on Bi2Te3 to demonstrate the exquisite peformances of our novel TR-ARPES endstation.

Conference Presentation

Citation Download Citation

Gaëtan Jargot, Adrien Longa, Jean-Michel Parent, Dario Armanno, Benson Frimpong, François Légaré, and Fabio Boschini "250 kHz repetition rate OPA and 6 EV line for TR-ARPES measurement", Proc. SPIE PC12869, Nonlinear Frequency Generation and Conversion: Materials and Devices XXIII, PC128690R (13 March 2024); https://doi.org/10.1117/12.3001015

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