Poster
5 October 2023 WS2/Au and WS2/Ag structures fabricated by metal-assisted exfoliation: Thickness-dependent physical properties
Eunseo Cho, Dong-Wook Kim, Nahyun Kim, Anh T. Nguyen, Seoyoung Lim, Jungeun Song, Jungyoon Cho, Soyeong Kwon
Author Affiliations +
Conference Poster
Abstract
WS2 flakes were prepared on template-stripped ultra-flat Au and Ag layers using a metal-assisted exfoliation technique, and their physical characteristics were investigated. The identification of the thickness for each flake is confirmed by the agreement between the measured and calculated optical reflectance spectra. Despite the extremely small flake thickness, the resonant cavity modes can appear in WS2/Au and WS2/Ag, according to the anticipated phase shifts of light. The contact potential difference of the flake was studied using Kelvin probe force microscopy to propose the interfacial band alignment. This work can provide valuable insights into the use of the 2D-semiconductor/metal structures for optoelectronic device applications.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eunseo Cho, Dong-Wook Kim, Nahyun Kim, Anh T. Nguyen, Seoyoung Lim, Jungeun Song, Jungyoon Cho, and Soyeong Kwon "WS2/Au and WS2/Ag structures fabricated by metal-assisted exfoliation: Thickness-dependent physical properties", Proc. SPIE PC12651, Low-Dimensional Materials and Devices 2023, PC126510W (5 October 2023); https://doi.org/10.1117/12.2677969
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KEYWORDS
Materials properties

Interfaces

Optoelectronic devices

Phase shifts

Raman spectroscopy

Reflectivity

Refractive index

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