CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume PC12619 > Article
Presentation
23 August 2023 Advanced in situ metrology for large aperture flat mirrors
Erhui Qi, Haixiang Hu, Xiao Luo, Zhenyu Liu
Author Affiliations +
Proceedings Volume PC12619, Modeling Aspects in Optical Metrology IX; PC1261904 (2023) https://doi.org/10.1117/12.2673949
Event: SPIE Optical Metrology, 2023, Munich, Germany
There is no online version at this time. The PDF is only available to people who have bought the paper or have a subscription.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Erhui Qi, Haixiang Hu, Xiao Luo, and Zhenyu Liu "Advanced in situ metrology for large aperture flat mirrors", Proc. SPIE PC12619, Modeling Aspects in Optical Metrology IX, PC1261904 (23 August 2023); https://doi.org/10.1117/12.2673949
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
Mirrors
Metrology
Manufacturing
Mirror surfaces
Surface finishing
Polishing
Testing and analysis
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top