Quantitative phase microscopy for metrology in nanophotonics

Guillaume Baffou

doi:10.1117/12.2652113

17 March 2023 Quantitative phase microscopy for metrology in nanophotonics

Guillaume Baffou

Proceedings Volume PC12410, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2023; PC124100G (2023) https://doi.org/10.1117/12.2652113
Event: SPIE LASE, 2023, San Francisco, California, United States

Abstract

In this presentation, I show how we have been using a particularly sensitive and simple quantitative phase microscopy technique(QPM) technique called cross-grating phase microscopy (CGM) for applications in nanophotonics, opening a new route of investigation for QPM, besides biology. This contribution is aimed to explain (i) how CGM can be used as a temperature microscopy technique to map the temperature of gold nanoparticles under illumination, enabling applications in physics, chemistry and biology at the nano/microscale; (ii) how CGM can map the complex optical conductivity and complex refractive index of 2D materials; (iii) how CGM can retrieve the complex optical polarizability of nanoparticles, along with the extinction, scattering and absorption cross sections from a single interferogram image, and finally (iv) how CGM can fully characterize metasurfaces.

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Citation Download Citation

Guillaume Baffou "Quantitative phase microscopy for metrology in nanophotonics", Proc. SPIE PC12410, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2023, PC124100G (17 March 2023); https://doi.org/10.1117/12.2652113

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KEYWORDS

Microscopy

Nanoparticles

Nanophotonics

Metrology

Biomedical optics

Chemistry

Interferometry

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