Machine learning for scanning probe and electron microscopy for materials discovery (Conference Presentation)

Sergei Kalinin; Yongtao Liu

doi:10.1117/12.2635229

4 October 2022 Machine learning for scanning probe and electron microscopy for materials discovery (Conference Presentation)

Sergei Kalinin, Yongtao Liu

Author Affiliations +

Proceedings Volume PC12204, Emerging Topics in Artificial Intelligence (ETAI) 2022; PC1220419 (2022) https://doi.org/10.1117/12.2635229
Event: SPIE Nanoscience + Engineering, 2022, San Diego, California, United States

Abstract

In this presentation, I will discuss recent progress in automated experiment in electron and scanning probe microscopy, ranging from feature to physics discovery via active learning, with the emphasis on the strucutred Gaussian Processes and hypothesis learning.

Conference Presentation

Citation Download Citation

Sergei Kalinin and Yongtao Liu "Machine learning for scanning probe and electron microscopy for materials discovery (Conference Presentation)", Proc. SPIE PC12204, Emerging Topics in Artificial Intelligence (ETAI) 2022, PC1220419 (4 October 2022); https://doi.org/10.1117/12.2635229

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