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30 May 2022 On-chip carrier-envelope phase scanner
Václav Hanus, Beatrix Fehér , Zsuzsanna Pápa, Judit Budai, Pallabi Paul, Adriana Szeghalmi, Péter Dombi
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Proceedings Volume PC12143, Nonlinear Optics and its Applications 2022; PC1214310 (2022) https://doi.org/10.1117/12.2620706
Event: SPIE Photonics Europe, 2022, Strasbourg, France
Abstract
Subwavelength size of nanophotonic devices in use with laser pulses at the few-cycle limit raises new questions about the spatial distribution of the carrier-envelope phase (CEP). It has been shown that the complexity of the CEP distribution for few-cycle laser pulses can go far beyond the axial phase flip, known as the Gouy phase. Moreover, the phase landscape is governed by various laser parameters, some of which can be deliberately changed in order to control the CEP distribution. To be able to fully grasp the control over CEP an accessible and reliable way to measure the distribution is needed. The measurement of CEP distribution of few-cycle laser pulses is challenging and the method so far relies on vacuum apparatus. Recently discovered light-driven CEP sensitive currents in dielectrics, which can be detected with microsized on-chip electrodes, offer a new perspective for the phase detection. In this work, we present a proof-of-principle method for measuring the CEP spatial distribution. With on-chip scanning the focal volume of tightly focused oscillator laser pulses we obtain the three-dimensional map of the phase with resolution down to 500 nm.
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Václav Hanus, Beatrix Fehér , Zsuzsanna Pápa, Judit Budai, Pallabi Paul, Adriana Szeghalmi, and Péter Dombi "On-chip carrier-envelope phase scanner", Proc. SPIE PC12143, Nonlinear Optics and its Applications 2022, PC1214310 (30 May 2022); https://doi.org/10.1117/12.2620706
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KEYWORDS
Scanners
Dielectrics
Electrodes
Pulsed laser operation
Colorimetry
Gold
Nanoparticles
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