Measuring Nanoscale Deformation in Plasmonic Materials due to Thermal Stress

Tiernan McCaughery; Robert Bowman

doi:10.1117/12.2632785

24 May 2022 Measuring Nanoscale Deformation in Plasmonic Materials due to Thermal Stress

Tiernan McCaughery, Robert Bowman

Proceedings Volume PC12131, Nanophotonics IX; PC121311N (2022) https://doi.org/10.1117/12.2632785
Event: SPIE Photonics Europe, 2022, Strasbourg, France

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Tiernan McCaughery and Robert Bowman "Measuring Nanoscale Deformation in Plasmonic Materials due to Thermal Stress", Proc. SPIE PC12131, Nanophotonics IX, PC121311N (24 May 2022); https://doi.org/10.1117/12.2632785

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