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24 May 2022 Picophotonics: visible invisible
Giorgio Adamo, Eng Aik Chan, Jinxiang Li, Tongjun Liu, Sergei Kurdiumov, Kevin F. MacDonald, Jun-Yu Ou, Nikitas Papasimakis, Eric Plum, Tanchao Pu, Carolina Rendón-Barraza, Yu Wang, Nikolay I. Zheludev
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Proceedings Volume PC12130, Metamaterials XIII; PC121300E (2022) https://doi.org/10.1117/12.2624471
Event: SPIE Photonics Europe, 2022, Strasbourg, France
Abstract
The resolution of conventional microscopy is limited to a half of the wavelength of light. We report on recent advances in applications of deep learning and topologically structured light to far-field non-destructive imaging with deep subwavelength resolution and to picometric metrology.
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Giorgio Adamo, Eng Aik Chan, Jinxiang Li, Tongjun Liu, Sergei Kurdiumov, Kevin F. MacDonald, Jun-Yu Ou, Nikitas Papasimakis, Eric Plum, Tanchao Pu, Carolina Rendón-Barraza, Yu Wang, and Nikolay I. Zheludev "Picophotonics: visible invisible", Proc. SPIE PC12130, Metamaterials XIII, PC121300E (24 May 2022); https://doi.org/10.1117/12.2624471
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KEYWORDS
Image resolution
Metrology
Microscopy
Nondestructive evaluation
Structured light
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