Presentation
4 April 2022 Deep-En-Chroma: mining the spectral fingerprints in single-kV CT acquisitions using energy integration detectors
Author Affiliations +
Abstract
CT imaging is one of the primary diagnostic medical imaging modalities. However, there is a long-standing technical limitation associated with conventional CT imaging: anatomical structures with different material compositions may have the same CT number, thereby limiting the ability to differentiate and classify different tissue types and contrast agents. To address this limitation, the currently available strategy is to modify the hardware acquisition systems such that dual energy CT (DECT) data acquisition scheme can be accommodated. In this work, we show that the elemental composition of a material can be directly extracted from a conventional single-kV CT acquisition without invoking DECT acquisition scheme.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yinsheng Li, Xin Tie, Ke Li, John Garrett, and Guang-Hong Chen "Deep-En-Chroma: mining the spectral fingerprints in single-kV CT acquisitions using energy integration detectors", Proc. SPIE PC12031, Medical Imaging 2022: Physics of Medical Imaging, PC120310I (4 April 2022); https://doi.org/10.1117/12.2611838
Advertisement
Advertisement
KEYWORDS
X-ray computed tomography

Mining

Sensors

Data acquisition

Imaging systems

X-rays

Human subjects

Back to Top