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7 March 2022 Multilayer terahertz thickness imaging at 1.6-kHz pixel rate
Daniel Molter, Kim-Sophie Ellenberger, Jens Klier, Stefan Weber, Joachim Jonuscheit, Georg von Freymann, Nico Vieweg, Katja Dutzi, Anselm Deninger
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Proceedings Volume PC12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV; PC120000H (2022) https://doi.org/10.1117/12.2615320
Event: SPIE OPTO, 2022, San Francisco, California, United States
Abstract
Terahertz layer thickness measurements is one of the most promising fields of applications for terahertz technology. Measuring subwavelength layers in multilayer systems is most commonly achieved by applying retrieval algorithms. These algorithms are computational demanding, which makes it hard for the evaluation to keep up with the increasing speed of modern terahertz systems. ECOPS-based systems now achieve measurement rates above 1 kHz. By applying a highly efficient algorithm based on desktop-grade CPU, we achieve multilayer imaging at 1.6 kHz measurement rate. A three-layer system on a metal disk of 300 mm diameter is measured in 2.5 minutes with 240000 pixels.
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Daniel Molter, Kim-Sophie Ellenberger, Jens Klier, Stefan Weber, Joachim Jonuscheit, Georg von Freymann, Nico Vieweg, Katja Dutzi, and Anselm Deninger "Multilayer terahertz thickness imaging at 1.6-kHz pixel rate", Proc. SPIE PC12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, PC120000H (7 March 2022); https://doi.org/10.1117/12.2615320
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KEYWORDS
Computing systems
Metals
Terahertz technology
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