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New time-correlated single photon counting (TCSPC) applications, like non-line-of-sight imaging, require a new generation of single photon avalanche diodes (SPAD) characterized by an instrument response function (IRF) having not only a narrow peak (< 100 ps FWHM) but also a very fast tail (~75 ps decay time). With such devices it is thus possible to detect two optical pulses as close as 200 ps in time, even if the second one is 2 orders of magnitude weaker than the first one. Such secondary peaks in the TCSPC histogram, can also be caused by reflections from internal optical surfaces of the optoelectronic assembly in which SPADs are mounted and thus are consequently undesirable. Options to mitigate these reflections or reduce the time of flight inside the assembly while not compromising photon detection efficiencies over a wide wavelength range are discussed.
Sven Mahnkopf,Andrea Giudice,Alessandro Ruggeri, andDavid Demmer
"Optoelectronic packaging of ultrafast-gated single photon avalanche diodes", Proc. SPIE PC11982, Components and Packaging for Laser Systems VIII, PC1198205 (1 April 2022); https://doi.org/10.1117/12.2610225
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Sven Mahnkopf, Andrea Giudice, Alessandro Ruggeri, David Demmer, "Optoelectronic packaging of ultrafast-gated single photon avalanche diodes," Proc. SPIE PC11982, Components and Packaging for Laser Systems VIII, PC1198205 (1 April 2022); https://doi.org/10.1117/12.2610225