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3 November 2016 X-ray induced chemical reaction revealed by in-situ X-ray diffraction and scanning X-ray microscopy in 15 nm resolution (Conference Presentation)
Mingyuan Ge, Wenjun Liu, David Bock, Vincent De Andrade, Hanfei Yan, Xiaojing Huang, Amy Marschilok, Esther Takeuchi, Huolin Xin, Yong S. Chu
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Proceedings Volume 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII; 99270H (2016) https://doi.org/10.1117/12.2237229
Event: SPIE Nanoscience + Engineering, 2016, San Diego, California, United States
Abstract
The detection sensitivity of synchrotron-based X-ray techniques has been largely improved due to the ever increasing source brightness, which have significantly advanced ex-situ and in-situ research for energy materials, such as lithium-ion batteries. However, the strong beam-matter interaction arisen from the high beam flux can significantly modify the material structure. The parasitic beam-induced effect inevitably interferes with the intrinsic material property, which brings difficulties in interpreting experimental results, and therefore requires comprehensive evaluation. Here we present a quantitative in-situ study of the beam-effect on one electrode material Ag2VO2PO4 using four different X-ray probes with different radiation dose rate. The material system we reported exhibits interesting and reversible radiation-induced thermal and chemical reactions, which was further evaluated under electron microscopy to illustrate the underlying mechanism. The work we presented here will provide a guideline in using synchrotron X-rays to distinguish the materials’ intrinsic behavior from extrinsic structure changed induced by X-rays, especially in the case of in-situ and operando study where the materials are under external field of either temperature or electric field.
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Mingyuan Ge, Wenjun Liu, David Bock, Vincent De Andrade, Hanfei Yan, Xiaojing Huang, Amy Marschilok, Esther Takeuchi, Huolin Xin, and Yong S. Chu "X-ray induced chemical reaction revealed by in-situ X-ray diffraction and scanning X-ray microscopy in 15 nm resolution (Conference Presentation)", Proc. SPIE 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII, 99270H (3 November 2016); https://doi.org/10.1117/12.2237229
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KEYWORDS
X-rays
X-ray diffraction
X-ray microscopy
Chemical reactions
Electrodes
Electron microscopy
Synchrotrons
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