Paper
16 December 1988 Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter
P. Dhez, S. Megtert, M F Ravet, E Ziegler
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Abstract
A 1D Position Sensitive Detector is well-suited to the test of the short period X-ray multilayer produced for X-ray fluorescence analysis systems and for synchrotron beam lines optics. Because it gives directly the incident and reflected angular beam distributions the PSD avoids the time-consuming scanning mode necessary for the classical detectors. In such tests classical X-ray tubes have been used. Some examples of reflectivity tests for multilayer mirrors with periods ranging from 113Å to 24Å are presented. A way is indicated to improve the 0.03° angular resolution which presently limits our reflectivity measurements possibility.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Dhez, S. Megtert, M F Ravet, and E Ziegler "Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter", Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); https://doi.org/10.1117/12.948774
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Cited by 10 scholarly publications.
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KEYWORDS
Reflectivity

Sensors

Crystals

X-rays

Monochromators

Mirrors

Laser crystals

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