Paper
4 April 2016 Sub-15nm patterning technology using directed self-assembly on nano-imprinting guide
Seiji Morita, Masahiro Kanno, Ryousuke Yamamoto, Norikatsu Sasao, Shinobu Sugimura
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Abstract
In next generation lithography to make sub-15nm pattern, Directed self-assembly (DSA) and Nano-imprint lithography (NIL) are proposed. The current DSA process is complicated and it is difficult to decrease width and line edge roughness of a guide pattern for sub-15nm patterning. In the case of NIL, it is difficult to make the master template having sub- 15nm pattern. This paper describes cost-effective lithography process for making sub-15nm pattern using DSA on a guide pattern replicated by Nano-imprinting (NIL + DSA). Simple process for making sub-15nm pattern is proposed. The quartz templates are made and line/space patterns of half pitch (hp) 12nm and hp9.5nm are obtained by NIL + DSA.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seiji Morita, Masahiro Kanno, Ryousuke Yamamoto, Norikatsu Sasao, and Shinobu Sugimura "Sub-15nm patterning technology using directed self-assembly on nano-imprinting guide", Proc. SPIE 9777, Alternative Lithographic Technologies VIII, 97770K (4 April 2016); https://doi.org/10.1117/12.2219141
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Nanoimprint lithography

Directed self assembly

Lithography

Optical lithography

Quartz

Line edge roughness

Image processing

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