Measurement Of Small Temperature Fluctuations At High Average Temperature

James W Scholl; Marija S. Scholl

doi:10.1117/12.948325

7 December 1988 Measurement Of Small Temperature Fluctuations At High Average Temperature

James W Scholl, Marija S. Scholl

Proceedings Volume 0972, Infrared Technology XIV; (1988) https://doi.org/10.1117/12.948325
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

Both absolute and differential temperature measurements were simultaneously performed as a function of time for a pixel on a high-temperature, multi-spectral, spatially and temporally varying infrared target simulator. A scanning laser beam was used to maintain a pixel at an on-the-average constant temperature of 520 K. The laser refresh rate of up to 1 kHz resulted in small-amplitude temperature fluctuations with a peak-to-peak amplitude of less than 1 K. The experimental setup to accurately measure the differential and the absolute temperature as a function of time is described.

Citation Download Citation

James W Scholl and Marija S. Scholl "Measurement Of Small Temperature Fluctuations At High Average Temperature", Proc. SPIE 0972, Infrared Technology XIV, (7 December 1988); https://doi.org/10.1117/12.948325

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