Defects detection for rough magnetic tiles surface based on light sectioning

Yuwei Wang; Jiayuan Tao; Xiangcheng Chen; Keyi Wang

doi:10.1117/12.2242700

27 September 2016 Defects detection for rough magnetic tiles surface based on light sectioning

Yuwei Wang, Jiayuan Tao, Xiangcheng Chen, Keyi Wang

Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 968434 (2016) https://doi.org/10.1117/12.2242700
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China

Abstract

Magnetic tile as a kind of product of mass production and wide application in electronic motors, and defects detection is a major issue in its production line. In this paper, a machine vision method based on black-stripe projection is presented to deal with this issue. Because of magnetic tile surface with black colors, rough structure and complex grinding textures, we abandon intensity imaging and resort to light sectioning methods which provides more reliable and abundant surface information. In order to suppress the speckle diffraction effect caused by laser light source, we used the light-emitting diode (LED) with incoherent characteristics. The black-stripe images were captured by a high-speed camera. A fast algorithm was developed to extract and compare both edges of the black-stripe, which could detect defects and eliminate the effects of vibrations. The experimental results show that the simple and fast processing method proposed in this paper can detect the structural defects such as micro pits and micro cracks.

Citation Download Citation

Yuwei Wang, Jiayuan Tao, Xiangcheng Chen, and Keyi Wang "Defects detection for rough magnetic tiles surface based on light sectioning", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968434 (27 September 2016); https://doi.org/10.1117/12.2242700

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KEYWORDS

Magnetism

Defect detection

Projection systems

Detection and tracking algorithms

Edge detection

Light emitting diodes

Algorithm development

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