On the statistical error of the half energy width

Giuseppe Vacanti

doi:10.1117/12.2188164

21 September 2015 On the statistical error of the half energy width

Giuseppe Vacanti

Proceedings Volume 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII; 96030I (2015) https://doi.org/10.1117/12.2188164
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

The half energy width (HEW) is the all powerful performance parameter used to characterize and compare X-ray optics. Values of HEW are always reported without an error bar or confidence interval, suggesting that the statistical error associated with such estimates are negligible. Is this true? And if it is, could one characterize the optics more quickly accepting a non-negligible but still acceptable statistical error in the estimate of the HEW? We try to answer these questions with the use of non-parametric statistical methods and X-ray pencile beam data. .

Citation Download Citation

Giuseppe Vacanti "On the statistical error of the half energy width", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96030I (21 September 2015); https://doi.org/10.1117/12.2188164

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available