Analysis of PV modules based on thin film solar cells by dark measurements technique

Kamel Agroui; Michelle Pellegrino; Flaminio Giovanni

doi:10.1117/12.2187369

23 September 2015 Analysis of PV modules based on thin film solar cells by dark measurements technique

Kamel Agroui, Michelle Pellegrino, Flaminio Giovanni

Proceedings Volume 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII; 95630M (2015) https://doi.org/10.1117/12.2187369
Event: SPIE Optics + Photonics for Sustainable Energy, 2015, San Diego, California, United States

Abstract

The dark measurements technique which were developed to analyze the material properties of solar cells in a PV module and performed either at DC or at AC conditions, can give useful information on the quality of the active material. This technique leads to better understanding the PV module degradation processes, occurring during indoor qualification testing or in real operating conditions. To this purpose an indoor testing laboratory has been set up to detect and monitor the PV modules degradation. A simple technique, based on the analysis of the behaviour of PV devices biased by an AC signal on dark conditions, has been developed to easily and quickly evaluate some parameters like the series, the shunt resistances and the capacitance affecting their electrical characteristics. In the present paper the technique basic concepts will be illustrated. Preliminary experimental results, achieved by applying the technique to some kinds of PV modules based on simple and triple junction’s silicon amorphous solar cells, will be presented.

Conference Presentation

Citation Download Citation

Kamel Agroui, Michelle Pellegrino, and Flaminio Giovanni "Analysis of PV modules based on thin film solar cells by dark measurements technique", Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 95630M (23 September 2015); https://doi.org/10.1117/12.2187369

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