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The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, edited by Neelkanth G. Dhere, John H. Wohlgemuth, Rebecca Jones-Albertus, Proceedings of SPIE Vol. 9563 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number. ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781628417296 Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) · Fax +1 360 647 1445 Copyright © 2015, Society of Photo-Optical Instrumentation Engineers. Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $18.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/15/$18.00. Printed in the United States of America. Publication of record for individual papers is online in the SPIE Digital Library.
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AuthorsNumbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10–1Z, 20–2Z, etc. Agroui, Kamel, 0M Alam, Muhammad Ashraful, 0C Alcantara, Christopher, 0L Amspacher, Lucas, 03 Arbet, Juraj, 0V Asadpour, Reza, 0C Barreau, Nicolas, 0H Berghold, J., 0A Bermel, Peter, 0C Biggie, R., 09 Birchmier, Jeff, 02 Boháček, Pavol, 0V Bokria, Jayesh G., 02 Bradley, Alexander Z., 03 Bringuier, S., 08 Brooks, A., 09 Bruckman, Laura S., 0L Chenvidhya, Dhirayut, 0E, 0G Chenvidhya, Tanokkorn, 0E, 0G Dang, Thomas, 0L Deceglie, Michael G., 0F Deline, Chris, 0F Dhere, Neelkanth G., 0I Dhere, Ramesh G., 0I Fagerholm, Cara L., 0L Fan, Zhenzhu, 0T Felder, Thomas C., 03 Foltz, Benjamin, 03 Foster, Christopher, 0H French, Roger H., 0L Frijters, Corné, 0H Fu, Oakland, 03 Gambogi, William J., 03 Garreau-iles, Lucie, 03 Giovanni, Flaminio, 0M Glick, Stephen H., 0B Goel, Nikhil, 0L Gok, Abdulkerim, 0L Grunow, P., 0A Gu, Xiaohong, 04, 05 Guha, Subhendu, 0I Hacke, Peter, 0B Hamzavy, Babak, 03 Han, Peide, 0Y Han, Xiaohu, 0T Hu, Hongjie, 03 Huang, W.-J., 08 Hunston, Donald L., 04 Huran, Jozef, 0U, 0V Janke, S., 0A Kempe, Michael D., 02 Kim, Jae Hyun, 04 Kleinová, Angela, 0U, 0V Koch, S., 0A Kopchick, James G., 03 Krommenhoek, Peter J., 05 Kurtz, Sarah R., 0B, 0F Lai, T., 09 Limsakul, Chamnan, 0E, 0G Lin, Chiao-Chi, 04, 05 Lou, Shishu, 0Y Lyu, Yadong, 04 MacQueen, Rowan, xi Masuda, Atsushi, 07 Miller, David C., 02 Muralidharan, K., 08 Nanjundiah, Kumar, 02 guyen, Tinh, 05 Nobles, Dylan L., 02 Packa, Juraj, 0U Parinya, Panom, 0E Paul, J., 08 Peacock, R. Scott, 03 Pellegrino, Michelle, 0M Perný, Milan, 0U Perrin, Greg, 0B Peshek, Timothy J., 0L Pingel, S., 0A Potter, B. G., Jr., 08, 09 Ren, Feifei, 0T Sakurai, Keiichiro, 02, 07 Šály, Vladimír, 0U Sangpongsanont, Yaowanee, 0E, 0G Sasinková, Vlasta, 0U, 0V Schmidt, Timothy W., xi Seapan, Manit, 0E, 0G Sekáčova, Mária, 0V Shioda, Tsuyoshi, 02, 0A Silverman, Timothy J., 0F Simmons-Potter, K., 08, 09 Songprakorp, Roongrojana, 0E, 0G Stanley, Deborah L., 04 Steijvers, Henk, 0H Stika, Katherine M., 03 Su, Yahui, 0T Takani, Masayoshi, 07 Takano, Akihiro, 07 Tannil, Nittaya, 0E Terry, Mason L., 0L Terwilliger, Kent, 0B Theelen, Mirjam, 0H Trout, T. John, 03 Tucker, John, 02 Ukar, A., 0A Vroon, Zeger, 0H Wan, Kai-Tak, 04 Ward, Allan, 0I Watson, Stephanie S., 05 Wheeler, Nicholas R., 0L Wiengmoon, Buntoon, 0E Wieting, Robert, 0I Wohlgemuth, John H., 02 Yoshihara, Toshio, 02 Yu, Bao-Ling, 03 Yu, Li-Chieh, 05 Zabiyaka, Davis, 0L Zeman, Miro, 0H Zhang, Huayong, 0T Zhou, Chao, 0C Zhu, Huishi, 0Y Zubillaga, Oihana, 02 Conference Committee
IntroductionThe eighth Reliability of Photovoltaic Cells, Modules, Components and Systems conference, part of the 2015 SPIE Optics + Photonics symposium, was composed of a full schedule of highly anticipated presentations from a number of highly regarded experts from both the photovoltaic (PV) industry and academia. The conference was well attended with a number of international papers from national laboratories, institutes and universities in the United States, Japan, Germany, Switzerland, Spain, Algeria, Italy, Thailand, and Brazil. The first session on Sunday on Encapsulant, Backsheet, and Packaging Materials was chaired by Keiichiro Sakurai from the National Institute of Advanced Industrial Science and Technology, (AIST) (Japan). The session included two invited talks on the development of a resistivity standard for polymeric materials and of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules of authors from United States, Japan and Switzerland. There were two presentations on cracking, delamination, and mechanical degradation of PV backsheets after accelerated laboratory testing and UV exposure. The second session on PV Module Reliability Accelerated and Outdoor Testing was chaired by Michel D. Kempe, National Renewable Energy Laboratory (United States). It had two invited talks on effects of UV and light illumination and sequential tests such as damp heat, temperature cycling, differential mechanical loading, and humidity freeze on flexible and rigid PV modules. Two other papers on experimental and computational investigation of microcrack behavior under combined environments and comparison of accelerated testing and field exposure. The third session on Potential Induced Degradation (PID) was chaired by Takuya Doi, AIST (Japan). It had three papers (two invited) on survey of PID in thin-film modules and material properties measurements, quality control counter measures and modeling framework for PID in PV modules. The fourth session entitled, “PV Module Reliability I,” was chaired by Juliane Berghold, PI Photovoltaik-Institut Berlin AG (Germany). It had invited and regular papers on reduction of PV rooftop system output power due to heat gain, partial shade stress test of thin-film PV modules, and module reliability improvements and growth of PV industry. This was followed by the symposium-wide plenary session. The first session on the second day on Thin Film PV Module Reliability was chaired by Rebecca Jones-Albertus, U.S. Dept. of Energy. It had one invited presentation on the effect of atmospheric species on the degradation of CIGS solar cells and molybdenum films. There were three regular presentations on the comparison of reliability of thin-film and multicrystalline silicon PV modules, analysis of thin film PV module degradation using data science, and dark measurements technique. The second session on PV Module Reliability II was chaired by Thomas C. Felder, DuPont (United States). The session had one invited presentation and three regular papers on white solar modules for building integrated photovoltaics, PV reliability group and its activities in the United States and Brazil. This was followed by plenary session which had a presentation on importance of reliability to the SunShot Initiative. Finally, on Monday afternoon there was a poster session. The conference organizers would like to thank each presenter for their contribution to the technical program and everyone who participated in this year’s conference for their interest and support. We wish everyone the best of luck in their technical and scientific endeavors, and would like to invite everyone back to next year’s conference to present their latest achievements in the Reliability of Photovoltaic Cells, Modules, Components and Systems. Neelkanth G. Dhere John H. Wohlgemuth Rebecca Jones-Albertus |
