Paper
19 February 2015 Estimating the complex index of refraction based on the rough surface polarization degree
Di Yang, Yonghong Zhan, Change Zeng
Author Affiliations +
Proceedings Volume 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014); 94491E (2015) https://doi.org/10.1117/12.2076028
Event: The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014), 2014, Xi'an, China
Abstract
The complex index of refraction was the fixed characteristic of the target material. In the remote sense field, the complex index of the refraction is a useful parameter for classify and recognize the material. To detect the complex index of the refraction of the opaque material was difficult. A new method of estimating the complex refraction index based on the measured polarization degree of the material according to the different incident angle of reflectance angle was provided. The result showed that the stability and reliability of the acquired complex refraction index was fine.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Di Yang, Yonghong Zhan, and Change Zeng "Estimating the complex index of refraction based on the rough surface polarization degree", Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94491E (19 February 2015); https://doi.org/10.1117/12.2076028
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KEYWORDS
Polarization

Refractive index

Dielectric polarization

Refraction

Reflectivity

Data modeling

Opacity

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