Simulated annealing method for material parameter extraction with terahertz time-domain spectroscopy

Dongxiong Ling; Hongcheng Wang; Xiaoyuan Huang; Yonghe Guan

doi:10.1117/12.2071026

11 November 2014 Simulated annealing method for material parameter extraction with terahertz time-domain spectroscopy

Dongxiong Ling, Hongcheng Wang, Xiaoyuan Huang, Yonghe Guan

Proceedings Volume 9275, Infrared, Millimeter-Wave, and Terahertz Technologies III; 927511 (2014) https://doi.org/10.1117/12.2071026
Event: SPIE/COS Photonics Asia, 2014, Beijing, China

Abstract

A simulated annealing method for material parameter extraction with terahertz time-domain spectroscopy is introduced to improve the common extraction method. The simulated annealing method seeks the global minimum of the error function to obtain material constants where the characterized material is not constrained by a certain boundary condition. It is shown from the research results that more accurate material parameters can be acquired to meet the actual requirements of material analysis by use of the simulated annealing method.

Citation Download Citation

Dongxiong Ling, Hongcheng Wang, Xiaoyuan Huang, and Yonghe Guan "Simulated annealing method for material parameter extraction with terahertz time-domain spectroscopy", Proc. SPIE 9275, Infrared, Millimeter-Wave, and Terahertz Technologies III, 927511 (11 November 2014); https://doi.org/10.1117/12.2071026

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