High brightness electron sources for MeV ultrafast diffraction and microscopy

P. Musumeci; R. K. Li

doi:10.1117/12.2062997

5 September 2014 High brightness electron sources for MeV ultrafast diffraction and microscopy

P. Musumeci, R. K. Li

Proceedings Volume 9198, Ultrafast Nonlinear Imaging and Spectroscopy II; 91980S (2014) https://doi.org/10.1117/12.2062997
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.

Citation Download Citation

P. Musumeci and R. K. Li "High brightness electron sources for MeV ultrafast diffraction and microscopy", Proc. SPIE 9198, Ultrafast Nonlinear Imaging and Spectroscopy II, 91980S (5 September 2014); https://doi.org/10.1117/12.2062997

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