Paper
24 July 2014 Prospects and limitations of DEPFET active pixel sensors as high speed spectroscopic x-ray imager for the ATHENA wide field imager
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Abstract
Since many years DEPFETs have been developed for space and ground based X-ray imaging and spectroscopy experiments. Prototypes have been successfully tested and qualified. Over the past years, the DEPFET technology was improved and additional features of DEPFETs were developed: increase of dynamic range, improvement of radiation hardness, implementation of electronic shutters, integration of an analog storage, reduction of readout noise and improvement of the low energy performance. This paper will present two novel DEPFET concepts which are able to fulfill the demanding requirements of the proposed ATHENA Wide Field Imager. It will summarize the most important DEPFET characteristics on the basis of measurements and device simulations, taking into account the given boundary conditions of the mission.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Aschauer, A. Bähr, G. Lutz, P. Majewski, L. Strüder, and J. Treis "Prospects and limitations of DEPFET active pixel sensors as high speed spectroscopic x-ray imager for the ATHENA wide field imager", Proc. SPIE 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray, 91442K (24 July 2014); https://doi.org/10.1117/12.2056398
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KEYWORDS
Field effect transistors

Electrons

Sensors

Transistors

Signal processing

Imaging systems

X-ray imaging

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