Femtosecond Maker Fringe analysis of induced second-order nonlinearities in poled silica

Christopher W. Smelser; Ksenia Yadav

doi:10.1117/12.2037095

11 October 2013 Femtosecond Maker Fringe analysis of induced second-order nonlinearities in poled silica

Christopher W. Smelser, Ksenia Yadav

Proceedings Volume 8915, Photonics North 2013; 891517 (2013) https://doi.org/10.1117/12.2037095
Event: Photonics North 2013, 2013, Ottawa, Canada

Abstract

Maker Fringe measurements are a common method for measuring the second-order non-linear coefficient of materials. Typically these measurements are made with laser sources that have pulse lengths exceeding 10 ps. In this presentation we will explore the use of a femtosecond source in a Maker Fringe measurement. We will look at how femtosecond Maker Fringes differ from those made with longer pulse sources. We will compare our theoretical calculations to experiments performed in poled silica.

Citation Download Citation

Christopher W. Smelser and Ksenia Yadav "Femtosecond Maker Fringe analysis of induced second-order nonlinearities in poled silica", Proc. SPIE 8915, Photonics North 2013, 891517 (11 October 2013); https://doi.org/10.1117/12.2037095

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