Effect of assembly error of polarization array on a Polarizing Atmospheric Michelson Interferometer

Lin Zhang; Chunmin Zhang; Wenyi Ren; Jinchan Wang

doi:10.1117/12.2034829

30 August 2013 Effect of assembly error of polarization array on a Polarizing Atmospheric Michelson Interferometer

Lin Zhang, Chunmin Zhang, Wenyi Ren, Jinchan Wang

Proceedings Volume 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications; 89101V (2013) https://doi.org/10.1117/12.2034829
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

A Static Polarizing Atmospheric Michelson Interferometer (SPAMI) system for multiple emission lines is reviewed. It changes the Optical Path Difference (OPD) by Polarization Array (PA) at one time, instead of rotating the polarizer by four times in traditional polarizing Michelson interferometer. This allows the NPAMI system to make simultaneous measurements. PA is a key element cemented by four polarizers with different polarization orientations in the SPAMI system. In practice, assembly error is brought to the polarization array unexpected. It is proved that the temperature and wind velocity measurements are highly depended on the polarization orientations of polarizers in PA. In this paper, the effect of deflection of polarization orientation on temperature and wind velocity are analyzed and discussed. Moreover, a proper approach is proposed to improve the accuracy of alignment.

Citation Download Citation

Lin Zhang, Chunmin Zhang, Wenyi Ren, and Jinchan Wang "Effect of assembly error of polarization array on a Polarizing Atmospheric Michelson Interferometer", Proc. SPIE 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications, 89101V (30 August 2013); https://doi.org/10.1117/12.2034829

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KEYWORDS

Polarization

Polarizers

Michelson interferometers

Doppler effect

Interferometers

Temperature metrology

Imaging systems

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