Developing a phase and intensity measurement technique with multiple incident angles under surface plasmon resonance condition

Chien-Yuan Han; Cheng You Du; Yi-Ren Chen; Yu-Faye Chao

doi:10.1117/12.2035029

19 September 2013 Developing a phase and intensity measurement technique with multiple incident angles under surface plasmon resonance condition

Chien-Yuan Han, Cheng You Du, Yi-Ren Chen, Yu-Faye Chao

Author Affiliations +

Proceedings Volume 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications; 89052N (2013) https://doi.org/10.1117/12.2035029
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

This work presents the application of a focused beam polarizer-sample-analyzer imaging ellipsometer in measuring the ellipsometric parameters under the surface plasmon resonance condition. By using a cylindrical lens to produce fan shaped beam with multiple incident angles, three-intensity measurement technique can measure the ellipsometric parameters against each incidence but without the need of calibrating the azimuth errors of polarizer and analyzer. As a result of multiple incident angles approach, the whole SPR curve can be obtained without rotating the sensor chip. The intensity and phase response in the air and water interface of the sensor chip were demonstrated, and almost all measured results are close to the theoretical model.

Citation Download Citation

Chien-Yuan Han, Cheng You Du, Yi-Ren Chen, and Yu-Faye Chao "Developing a phase and intensity measurement technique with multiple incident angles under surface plasmon resonance condition", Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 89052N (19 September 2013); https://doi.org/10.1117/12.2035029

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