Imaging FTIR emissivity measurement method

Edward M. Burdette; C. Spencer Nichols; Sarah E. Lane; Keith F. Prussing; J. Michael Cathcart

doi:10.1117/12.2023415

23 September 2013 Imaging FTIR emissivity measurement method

Edward M. Burdette, C. Spencer Nichols, Sarah E. Lane, Keith F. Prussing, J. Michael Cathcart

Proceedings Volume 8870, Imaging Spectrometry XVIII; 88700B (2013) https://doi.org/10.1117/12.2023415
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

Though many materials behave approximately as greybodies across the long-wave infrared (LWIR) waveband, certain important infrared (IR) scene modeling materials such as brick and galvanized steel exhibit more complex optical properties¹. Accurately describing how non-greybody materials interact relies critically on the accurate incorporation of the emissive and reflective properties of the in-scene materials. Typically, measured values are obtained and used. When measured using a non-imaging spectrometer, a given material’s spectral emissivity requires more than one collection episode, as both the sample under test and a standard must be measured separately. In the interval between episodes changes in environment degrade emissivity measurement accuracy. While repeating and averaging measurements of the standard and sample helps mitigate such effects, a simultaneous measurement of both can ensure identical environmental conditions during the measurement process, thus reducing inaccuracies and delivering a temporally accurate determination of background or ‘down-welling’ radiation. We report on a method for minimizing temporal inaccuracies in sample emissivity measurements. Using a LWIR hyperspectral imager, a Telops Hyper-Cam², an approach permitting hundreds of simultaneous, calibrated spectral radiance measurements of the sample under test as well as a diffuse gold standard is described. In addition, we describe the data reduction technique to exploit these measurements. Following development of the reported method, spectral reflectance data from 10 samples of various materials of interest were collected. These data are presented along with comments on how such data will enhance the fidelity of computer models of IR scenes.

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Edward M. Burdette, C. Spencer Nichols, Sarah E. Lane, Keith F. Prussing, and J. Michael Cathcart "Imaging FTIR emissivity measurement method", Proc. SPIE 8870, Imaging Spectrometry XVIII, 88700B (23 September 2013); https://doi.org/10.1117/12.2023415

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KEYWORDS

Reflectivity

Infrared radiation

Aluminum

FT-IR spectroscopy

Sensors

Infrared imaging

Long wavelength infrared

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