Responsivity mapping techniques for the non-positional CCD: the swept charge device CCD236

P. H. Smith; N. J. Murray; C. MacCormick; J. P. D. Gow; D. Weatherill; E. Allanwood; P. Pool; A. D. Holland

doi:10.1117/12.2028865

26 September 2013 Responsivity mapping techniques for the non-positional CCD: the swept charge device CCD236

P. H. Smith, N. J. Murray, C. MacCormick, J. P. D. Gow, D. Weatherill, E. Allanwood, P. Pool, A. D. Holland

Proceedings Volume 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII; 88590M (2013) https://doi.org/10.1117/12.2028865
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

The e2v CCD236 is a swept charge device (SCD) designed as a soft X-ray detector for spectroscopy in the range 0.8 keV to 10 keV [1]. It benefits from improvements in design over the previous generation of SCD (the e2v CCD54) [2] to allow for increased detector area, a reduction in split X-ray events and improvements to radiation hardness [3]. To enable the suppression of surface dark current the device is clocked continuously, therefore there is no positional information making responsivity variations difficult to measure. This paper describes investigated techniques to achieve a responsivity map across the device using masking and XRF, and spot illumination from an organic light-emitting diode (OLED). The results of this technique should allow a deeper understanding of the device sensitivity and allow better data interpretation in SCD applications.

Citation Download Citation

P. H. Smith, N. J. Murray, C. MacCormick, J. P. D. Gow, D. Weatherill, E. Allanwood, P. Pool, and A. D. Holland "Responsivity mapping techniques for the non-positional CCD: the swept charge device CCD236", Proc. SPIE 8859, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII, 88590M (26 September 2013); https://doi.org/10.1117/12.2028865

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