Paper
25 September 2013 Ferroelectric memory element based on thin film field effect transistor
A. R. Poghosyan, N. R. Aghamalyan, E. Y. Elbakyan, R. Guo, R. K. Hovsepyan
Author Affiliations +
Abstract
We report the preparation and investigation of ferroelectric field effect transistors (FET) using ZnO:Li films with high field mobility of the charge carriers as a FET channel and as a ferroelectric active element simultaneously. The possibility for using of ferroelectric FET based on the ZnO:Li films in the ZnO:Li/LaB6 heterostructure as a bi-stable memory element for information recording is shown. The proposed ferroelectric memory structure does not manifest a fatigue after multiple readout of once recorded information.
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A. R. Poghosyan, N. R. Aghamalyan, E. Y. Elbakyan, R. Guo, and R. K. Hovsepyan "Ferroelectric memory element based on thin film field effect transistor", Proc. SPIE 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII, 88471R (25 September 2013); https://doi.org/10.1117/12.2027429
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KEYWORDS
Polarization

Switching

Field effect transistors

Thin films

Picosecond phenomena

Binary data

Electrons

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