Thermal Quasi-Reflectography (TQR): current research and potential applications

Claudia Daffara; Dario Ambrosini; Luca Pezzati; Giacomo Marchioro

doi:10.1117/12.2022155

30 May 2013 Thermal Quasi-Reflectography (TQR): current research and potential applications

Claudia Daffara, Dario Ambrosini, Luca Pezzati, Giacomo Marchioro

Proceedings Volume 8790, Optics for Arts, Architecture, and Archaeology IV; 87900S (2013) https://doi.org/10.1117/12.2022155
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

Thermal Quasi Reflectography (TQR), e.g. imaging in the thermal band 3-5 μm (MWIR), is discussed as innovative tool for the noninvasive analysis of pictorial surface layers in artworks, and its potential is demonstrated in some applications. The results encourage further developments in this field. The novel experimental technique, which has been recently introduced by the authors, is reviewed here giving focus to current research and potential applications.

Citation Download Citation

Claudia Daffara, Dario Ambrosini, Luca Pezzati, and Giacomo Marchioro "Thermal Quasi-Reflectography (TQR): current research and potential applications", Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900S (30 May 2013); https://doi.org/10.1117/12.2022155

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