Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer

B. Emprin; Ph. Troussel; B. Villette; F. Delmotte

doi:10.1117/12.2016832

3 May 2013 Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer

B. Emprin, Ph. Troussel, B. Villette, F. Delmotte

Proceedings Volume 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III; 87771B (2013) https://doi.org/10.1117/12.2016832
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

A new channel of an X-ray broadband spectrometer has been developed for the 2 – 4 keV spectral range. It uses a spectral filtering by using a non-periodic multilayer mirror. This channel is composed by a filter, an aperiodic multilayer mirror and a detector. The design and realization of the optical coating mirror has been defined such as the reflectivity is above 8% in almost the entire bandwidth range 2 – 4 keV and lower than 2% outside. The mirror is optimized for working at 1.9° grazing incidence. The mirror is coated with a stack of 115 chromium / scandium (Cr / Sc) non-periodic layers, between 0.6 nm and 7.3 nm and a 3 nm thick top SiO₂ layer to protect the stack from oxidization. To control thin thicknesses, we produced specific multilayer mirrors which consist on a superposition of two periodic Cr / Sc multilayers with the layer to calibrate in between. The mirror and subnanometric layers characterizations were made at the “Laboratoire Charles Fabry” (LCF) with a grazing incidence reflectometer working at 8.048 keV (Cu Kα radiation) and at the synchrotron radiation facility SOLEIL on the hard X-ray branch of the “Metrology” beamline. The reflectivity of the mirrors as a function of the photon energy was obtained in the Physikalisch Technische Bundesanstalt (PTB) laboratory at the synchrotron radiation facility Bessy II.

Citation Download Citation

B. Emprin, Ph. Troussel, B. Villette, and F. Delmotte "Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer", Proc. SPIE 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III, 87771B (3 May 2013); https://doi.org/10.1117/12.2016832

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KEYWORDS

Mirrors

Reflectivity

Chromium

Silica

Multilayers

X-rays

Silicon

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