Paper
28 June 2013 Effect of cleaning chemistry on MegaSonic damage
Author Affiliations +
Abstract
Acoustic energy applied through the cleaning media results into two kinds of cavitation effects; namely stable and transient cavitation. A uniformly pulsating bubble transforms into stable cavitation behavior whereas a bubble implosion implies transient cavitation. Pattern damage of sensitive features on advanced masks as well as Ru pitting on EUVL reticles is mostly the result of transient cavitation. Stable cavitation on the other hand produces a very narrowly controlled energy distribution which allows cleaning without damage. Stable cavitation can be achieved by suitably tailoring physical, chemical and thermodynamic properties of the liquid and gas media. In this paper we investigate a new cleaning chemistry that has favorable physical and thermodynamic properties to produce stable MegaSonic cavitation. The cavitation created in this chemistry is characterized by measuring acoustic energy as well as by pattern damage and particle removal efficiency on mask level. The chemical properties (pH and zeta potential) of this chemistry are compared with conventional cleaning chemistries. Its effects on CD shift as well as phase and transmission loss are also studied.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sherjang Singh, Uwe Dietze, and Peter Dress "Effect of cleaning chemistry on MegaSonic damage", Proc. SPIE 8701, Photomask and Next-Generation Lithography Mask Technology XX, 870104 (28 June 2013); https://doi.org/10.1117/12.2027974
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Chemistry

Cavitation

Acoustics

Particles

Ions

SRAF

Photomasks

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