Filter-based interrogation unit for optical wavelength shift sensors

Roland Wuchrer; Thomas Härtling

doi:10.1117/12.2009093

11 April 2013 Filter-based interrogation unit for optical wavelength shift sensors

Roland Wuchrer, Thomas Härtling

Proceedings Volume 8693, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013; 869304 (2013) https://doi.org/10.1117/12.2009093
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2013, San Diego, California, United States

Abstract

We present a filter-based spectrometer consisting of a dielectric thin film filter with a lateral-spectral transmission gradient (linear variable filter) and a position detector which allows high resolution in wavelength shift registration. The resolving capacity of two interrogation unit variants (with segmented and homogeneous position detector, respectively) is examined using a monochromatic tunable light source. On the basis of the obtained results, we discuss several advantages and drawbacks of this interrogation approach.

Citation Download Citation

Roland Wuchrer and Thomas Härtling "Filter-based interrogation unit for optical wavelength shift sensors", Proc. SPIE 8693, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2013, 869304 (11 April 2013); https://doi.org/10.1117/12.2009093

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