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9 April 2013 Fault detection in word-level nanoICs using vector Boolean derivatives
Samuel C. Lee, Fadhil Aula
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Proceedings Volume 8691, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2013; 86910E (2013) https://doi.org/10.1117/12.2009527
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2013, San Diego, California, United States
Abstract
This paper consists of four parts: (1) The word-level representations of digital circuits which included (a) word-level arithmetic representation, (b) word-level sum-of-products representation, and (c) word-level Reed-Muller representation. (2) The three word-level nano ICs circuit designs. (3) The introduction of the vector Boolean derivative. (4) The fault detection in word-level digital circuits using the vector Boolean derivative. The formulas for deriving tests for detecting stuck-at-0 (s-a-0) and stuck-at-1(s-a-1) are given word-level digital circuit presented in in any of the three representations.
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Samuel C. Lee and Fadhil Aula "Fault detection in word-level nanoICs using vector Boolean derivatives", Proc. SPIE 8691, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2013, 86910E (9 April 2013); https://doi.org/10.1117/12.2009527
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KEYWORDS
Digital electronics
Biosensors
Computer engineering
Current controlled current source
Nanosensors
Sensors
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