Reliability studies on MEMS shutters and displays

Joyce H. Wu; J. Lodewyk Steyn

doi:10.1117/12.2020033

9 March 2013 Reliability studies on MEMS shutters and displays

Joyce H. Wu, J. Lodewyk Steyn

Proceedings Volume 8614, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII; 861407 (2013) https://doi.org/10.1117/12.2020033
Event: SPIE MOEMS-MEMS, 2013, San Francisco, California, United States

Abstract

Mobile devices have become an integral part of everyday life, and as the primary input/output interface, the display now represents a key factor of user experience. The display also consumes increasingly more of the power budget than ever before, resulting in a challenge for device makers to reduce display power consumption without negatively impacting perceived image quality. Pixtronix displays are digital, trans-flective and offer a low-power advantage, without sacrificing brightness or color gamut. Incumbent display technologies such as LCD, lose over 90% of backlight output due to polarizers and color filters. The core of the Pixtronix MEMS-based display technology is the Digital Micro Shutter (DMS). The micro-shutters are fabricated on active TFT backplanes in conventional LCD fabrication facilities. To complete the DMS display system, an aperture plate and backlight are added, and the display is filled with a fluid. This display technology promises a significant reduction in power consumption over conventional LCD displays, while maintaining the high-brightness, wide color gamut, 24-bit color video capabilities that users expect from today's mobile devices.

Citation Download Citation

Joyce H. Wu and J. Lodewyk Steyn "Reliability studies on MEMS shutters and displays", Proc. SPIE 8614, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII, 861407 (9 March 2013); https://doi.org/10.1117/12.2020033

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