Paper
19 October 1987 Information Model For Electronic Assembly Line
E Maksa
Author Affiliations +
Proceedings Volume 0857, IECON'87:Automated Design and Manufacturing; (1987) https://doi.org/10.1117/12.943283
Event: IECON, Cambridge, 1987, Cambridge, MA, United States
Abstract
The CIM's view of manufacturing as a system, working towards common goals through the sharing of common information, should guide any design, analysis or retrofit efforts related to production systems. The line/cell information model presented here, which is based on the concept of an irreducible set of interacting information objects, reflects such a view. It allows access to information from higher levels of system hierarchy. CAD and CAM files supply the model with the context necessary for meaningful line autonomy and real-time reporting. Evolving knowledge about the line functionality is supported by an abstraction/inheritance class mechanism. The model is suitable not only for integration of hi-tech production technology, but also for use in traditional assembly lines (as shown in the implementation example).
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E Maksa "Information Model For Electronic Assembly Line", Proc. SPIE 0857, IECON'87:Automated Design and Manufacturing, (19 October 1987); https://doi.org/10.1117/12.943283
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Data modeling

Inspection

Manufacturing

Computer aided design

Solid modeling

Databases

Systems modeling

RELATED CONTENT

Virtual manufacturing in reality
Proceedings of SPIE (October 13 2000)
Optimizing product life cycle processes in design phase
Proceedings of SPIE (February 11 2002)
CAD/CAM-coupled image processing systems
Proceedings of SPIE (August 01 1990)
Green inspection station
Proceedings of SPIE (November 11 2010)
From CAD to geons a simplified data representation for...
Proceedings of SPIE (March 08 1999)

Back to Top