Paper
15 October 2012 Grain growth study of electrochemically deposited CuInSe2 by rapid thermal annealing in sulfur atmosphere
Ashish Bhatia, M. A. Karmarkar, H. Meadows, P. J. Dale, M. A. Scarpulla
Author Affiliations +
Proceedings Volume 8549, 16th International Workshop on Physics of Semiconductor Devices; 85493B (2012) https://doi.org/10.1117/12.926972
Event: 16th International Workshop on Physics of Semiconductor Devices, 2011, Kanpur, India
Abstract
In order to upscale the production of thin film solar cells a cost effective and simple synthesis technique is required. Keeping this in mind we have investigated the effect of electrochemical deposition (ED) and inherently low thermal budget rapid thermal annealing (RTA) processing of CuInSe2 in sulfur atmosphere. X-ray diffraction (θ-2θ) scans indicate increased grain size and improved crystallinity after RTA of ED films. Scanning electron microscopy images (SEM) suggest changes in surface morphology after sulfur incorporation. Raman spectroscopy results and temperature dependent conductivity measurements are also discussed in the paper.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashish Bhatia, M. A. Karmarkar, H. Meadows, P. J. Dale, and M. A. Scarpulla "Grain growth study of electrochemically deposited CuInSe2 by rapid thermal annealing in sulfur atmosphere", Proc. SPIE 8549, 16th International Workshop on Physics of Semiconductor Devices, 85493B (15 October 2012); https://doi.org/10.1117/12.926972
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Cited by 3 scholarly publications.
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KEYWORDS
Annealing

Sulfur

Scanning electron microscopy

Raman spectroscopy

Temperature metrology

Crystals

Selenium

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