Single event upset injection simulation and fault-tolerant design for image compression applications

Jie Guo; Yunsong Li; Kai Liu; Jie Lei; Chengke Wu

doi:10.1117/12.929470

19 October 2012 Single event upset injection simulation and fault-tolerant design for image compression applications

Jie Guo, Yunsong Li, Kai Liu, Jie Lei, Chengke Wu

Proceedings Volume 8514, Satellite Data Compression, Communications, and Processing VIII; 851403 (2012) https://doi.org/10.1117/12.929470
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

This paper describes a SEU fault injection framework. Based on the assumption of SEU effects and SEU distribution, the quantitative analysis between measured data and simulation model is investigated. By adjusting some parameters in the simulation-based framework, the proposed framework can be very possibly close to the published data and some accelerated radiation experiments. Furthermore, how the JPEG2000 based hardware architecture is sensitive to SEUs can be found out. In terms of hardware resources and operating frequencies, some fault-tolerant techniques can be introduced to the more sensitive parts, which show the framework's effectiveness in fault-tolerant design for image compression applications.

Citation Download Citation

Jie Guo, Yunsong Li, Kai Liu, Jie Lei, and Chengke Wu "Single event upset injection simulation and fault-tolerant design for image compression applications", Proc. SPIE 8514, Satellite Data Compression, Communications, and Processing VIII, 851403 (19 October 2012); https://doi.org/10.1117/12.929470

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