Paper
15 October 2012 Negative refractive index in ferromagnetic semiconductors: experimental verification
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Abstract
In this work, we show that natural crystals, or magnetic semiconductor, Cr-doped indium oxide, has a negative refractive index at ~ 27.8 micron wavelength. The effect was predicted by two of us a few years ago (A.G. Kussow and A. Akyurtlu, Phys. Rev. B, 78, 205202 (2008)). Our result seriously undermines wide-spread opinion that only composite artificial metamaterials can demonstrate negative refractive index. Thin ferromagnetic films of ICO were fabricated by original post-annealing sputtering method. FTIR R and T measurements were processed to extract refractive index within the range of interest. The extracted from combined transmittance and reflectance FTIR data negative refractive index band parameters are found to be close to expected one.
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Adil-Gerai Kussow, Yassine Ait El Aoud, Hamzeh M. Jaradat, and Alkim Akyurtlu "Negative refractive index in ferromagnetic semiconductors: experimental verification", Proc. SPIE 8455, Metamaterials: Fundamentals and Applications V, 84551F (15 October 2012); https://doi.org/10.1117/12.928198
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KEYWORDS
Refractive index

Ferromagnetics

Reflectivity

Thin films

Indium oxide

Reflection

Oxygen

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