Ellipsometrical detection of optical trapped nanoparticles by periodically localized light

Naoya Taki; Yasuhiro Mizutani; Tetsuo Iwata; Takao Kojima; Hiroki Yamamoto; Takahiro Kozawa

doi:10.1117/12.922879

4 May 2012 Ellipsometrical detection of optical trapped nanoparticles by periodically localized light

Naoya Taki, Yasuhiro Mizutani, Tetsuo Iwata, Takao Kojima, Hiroki Yamamoto, Takahiro Kozawa

Proceedings Volume 8430, Optical Micro- and Nanometrology IV; 84300Y (2012) https://doi.org/10.1117/12.922879
Event: SPIE Photonics Europe, 2012, Brussels, Belgium

Abstract

The purpose of this study is development of a trapping system for nano-particles by periodically localized light and of a detecting system for the trapped state by an ellipsometoric method. Nano-particles are of interest for some different attractive properties with a bulk body in terms of their reactivity. Those attractive properties are applicable to production of an optical element and a device. For production of nano-particles, it is necessary to manipulate nano-particles and to measure the trapped state without contact in micro region. In this study, periodically localized light which is generated by the nano-periodic structure allows us to trap nano-particles. Evaluation of trapping can be accomplished by using a rotating-analyzer ellipsometer for comparing the ellipsometrical parameter before and after trapping. In confirmation of affectivity ellipsometrical method, we obtained that the trapped state associated with varying a shape of the nanoperiodic structure depends on polarization properties. The trapping light intensity also was found to depend on trapping volume of the nano-particles. From experimental results, the nano-particles can be trapped by the periodically localized light. And the trapping volume was found to increase with increasing in trapping light intensity. Hence, this system achieved trapping and deducing nano-particles.

Citation Download Citation

Naoya Taki, Yasuhiro Mizutani, Tetsuo Iwata, Takao Kojima, Hiroki Yamamoto, and Takahiro Kozawa "Ellipsometrical detection of optical trapped nanoparticles by periodically localized light", Proc. SPIE 8430, Optical Micro- and Nanometrology IV, 84300Y (4 May 2012); https://doi.org/10.1117/12.922879

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Optical tweezers

Silicon

Nanoparticles

Polarization

Interfaces

Phase measurement

Polarizers

Show All Keywords

Keywords/Phrases

Search In:

Publication Years