Photon-counting image assessment based on standard mutual information using improved 2D entropy

Ruiqing He; Qian Chen; Yaojin Chen; Wei Cheng; Weiji He

doi:10.1117/12.975826

15 October 2012 Photon-counting image assessment based on standard mutual information using improved 2D entropy

Ruiqing He, Qian Chen, Yaojin Chen, Wei Cheng, Weiji He

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 841717 (2012) https://doi.org/10.1117/12.975826
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Traditional assessment methods don’t fit for photon-counting image (PCI) system because the output of PCI system is the number of photon instead of the gray value. Normalized mutual information is presented to assess Photon-counting image system performance and calculated based on improved 2D entropy for PCI system to provide the fidelity of PCI system. Probabilities of target classification error are introduced by Bayesian posterior probability classification method under the different fidelity conditions and the result confirms fidelity values. This method applied in the PCI experiments can reflect image fidelity and system performance well in different experiment conditions and supplies the evidences for assessing the quality for photon-counting image.

Citation Download Citation

Ruiqing He, Qian Chen, Yaojin Chen, Wei Cheng, and Weiji He "Photon-counting image assessment based on standard mutual information using improved 2D entropy", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841717 (15 October 2012); https://doi.org/10.1117/12.975826

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