Research of processing method for infrared image of sandwich
structure composite

Yan Huo; Cun-Lin Zhang; Chun-Yu Hu; Chun-Guang Li

doi:10.1117/12.978926

15 October 2012 Research of processing method for infrared image of sandwich structure composite

Yan Huo, Cun-Lin Zhang, Chun-Yu Hu, Chun-Guang Li

Proceedings Volume 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 84170K (2012) https://doi.org/10.1117/12.978926
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Composite sandwich structure has been widely used in aerospace due to its lightweight, high stiffness and strength. Existence of delaminations in the structure reduce the performance of the composites significantly, such flaws can be detected effectively and non-destructively by non-contact pulsed infrared thermography, but the contrast of infrared images of the material is low due to complex structure, so delaminations and sound area are difficult to be differentiated. In this paper, sandwich structure composites with aluminum facesheet and aluminum honeycomb cores are chosen as study objectives, several round-shape and rectangle-shape Teflon inserts with different sizes embedded in specimen, which simulate delaminations in the structure, and the processing method of infrared image is developed. The thermal image is processed through image denoising, image enhancement and feature extraction, and then the sizes of the defects are determined. Refer to the designed sizes, the results show that the accuracy of sizes measured by image processing is more than 90% for the defects bigger than Φ10mm , these results demonstrated that detecting accuracy of the structure is higher by infrared image processing.

Citation Download Citation

Yan Huo, Cun-Lin Zhang, Chun-Yu Hu, and Chun-Guang Li "Research of processing method for infrared image of sandwich structure composite", Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170K (15 October 2012); https://doi.org/10.1117/12.978926

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