Paper
23 March 1988 Thermal Stability Of LiNbO3 Electro-Optic Waveguide Modulators For Remote Voltage Sensing
C. Duchet, P. Fabre, M. Di Maggio
Author Affiliations +
Proceedings Volume 0838, Fiber Optic and Laser Sensors V; (1988) https://doi.org/10.1117/12.942487
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States
Abstract
The thermal instability of the working point of integrated devices may arise from photoelastic effect. MACH-ZEHNDER interferometer with special electrode structure, previously designed to have a high voltage sensitivity, leads also to a good thermal stability.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Duchet, P. Fabre, and M. Di Maggio "Thermal Stability Of LiNbO3 Electro-Optic Waveguide Modulators For Remote Voltage Sensing", Proc. SPIE 0838, Fiber Optic and Laser Sensors V, (23 March 1988); https://doi.org/10.1117/12.942487
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Electrodes

Waveguides

Modulators

Interferometers

Temperature metrology

Thermal effects

Electro optics

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